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The International trademark EPSILON was filed as Word mark on 09/21/2016 at the World Intellectual Property Organization.
| Trademark form | Word mark |
| File reference | 1332674 |
| Countries | 
|
| Base trademark |
No. ,
November 17, 2024
|
| Application date | September 21, 2016 |
| Expiration date | September 21, 2026 |
Trademark owner
Lelyweg 1
7602 EA Almelo
NL
7602 EA Almelo
NL
Trademark representatives
Avenida Maisonnave, 22
E-03003 Alicante
ES
goods and services
09
Computer software; computer software for analysis purposes;
computer software for use in relation to diffractometry;
computer software for use in relation to spectrometry;
computer software for use in relation to x-ray fluorescence
analysis; computer software for use in relation to the
determination of X-ray intensities; computer software for
use in relation to the determination of the thickness of
layer samples; computer software for use in relation to the
determination of chemical composition; computer software for
use in relation to the standardless analysis of samples;
none of the aforesaid goods being for use in the field of
psychological testing; scientific and measuring apparatus
and instruments; X-ray detectors; X-ray imaging detectors;
photon counting X-ray detectors; X-ray analytical apparatus;
diffractometers; X-ray diffraction apparatus, X-ray
diffractometers; X-ray analysers; wafer analysers; X-ray
tubes; X-ray apparatus; computer software and hardware
relating to X-ray diffraction and X-ray diffraction
apparatus; spectrometers; parts and fittings for all the
aforesaid; none of the aforesaid goods being for use in the
field of psychological testing
37
Construction and repair of scientific and measuring
apparatus and instruments, X-ray detectors, X-ray imaging
detectors, photon counting X-ray detectors, X-ray
diffraction apparatus, diffractometers, X-ray
diffractometers, X-ray analysers, wafer analysers and X-ray
tubes; installation of scientific and measuring apparatus
and instruments, X-ray detectors, X-ray imaging detectors,
photon counting X-ray detectors, X-ray diffraction
apparatus, diffractometers, X-ray diffractometers, X-ray
analysers, wafer analysers and X-ray tubes; information,
advisory and consultancy services all relating to the
aforesaid
42
Scientific and technological services and design relating
thereto; design, development and programming of computer
software; industrial analysis and research services; leasing
and rental of scientific and measuring apparatus and
instruments, X-ray detectors, X-ray imaging detectors,
photon counting X-ray detectors, X-ray analytical apparatus,
X-ray apparatus, X-ray diffraction apparatus,
diffractometers, X-ray diffractometers, X-ray analysers,
wafer analysers and X-ray tubes; design of scientific and
measuring apparatus and instruments, X-ray detectors, X-ray
imaging detectors, photon counting X-ray detectors, X-ray
analytical apparatus, X-ray apparatus, X-ray diffraction
apparatus, diffractometers, X-ray diffractometers, X-ray
analysers, wafer analysers and X-ray tubes; provision of
technological advice and consultancy services relating to
the selection, operation, and use of scientific and
measuring apparatus and instruments, X-ray detectors, X-ray
imaging detectors, photon counting X-ray detectors, X-ray
analytical apparatus, X-ray apparatus, X-ray diffraction
apparatus, diffractometers, X-ray diffractometers, X-ray
analysers, wafer analysers and X-ray tubes
Trademark history
| Date | Document number | Area | Entry |
|---|---|---|---|
| October 2, 2019 | 2019/45 Gaz | EM | RAW: Partial Ceasing Effect |
| September 27, 2018 | 2018/40 Gaz | US | RAW: Rule 18ter(2)(ii) GP following a provisional refusal |
| May 23, 2018 | 2018/23 Gaz | CN | Rejection |
| February 16, 2018 | 2018/12 Gaz | EM | RAW: Partial Ceasing Effect |
| December 14, 2017 | 2018/3 Gaz | JP | RAW: Rule 18ter(2)(ii) GP following a provisional refusal |
| June 29, 2017 | 2017/26 Gaz | JP | Rejection |
| March 6, 2017 | 2017/10 Gaz | US | Rejection |
| September 21, 2016 | 2017/6 Gaz | EM | Registration |
ID: 141332674