NANOANDMORE

USPTO USPTO 2006 SECTION 71 ACCEPTED

Schützen Sie diese Marke vor Nachahmern!

Mit unserer Markenüberwachung werden Sie automatisch per E-Mail über Nachahmer und Trittbrettfahrer benachrichtigt.

Die US-Marke NANOANDMORE wurde als Wortmarke am 27.01.2006 beim Amerikanischen Patent- und Markenamt angemeldet.
Sie wurde am 23.10.2007 im Markenregister eingetragen. Der aktuelle Status der Marke ist "SECTION 71 ACCEPTED".

Markendetails

Markenform Wortmarke
Aktenzeichen 79021737
Registernummer 3318458
Anmeldedatum 27. Januar 2006
Veröffentlichungsdatum 07. August 2007
Eintragungsdatum 23. Oktober 2007

Markeninhaber

CH-2000 Neuchâtel

Markenvertreter

Waren und Dienstleistungen

9 Scientific apparatus and instruments, namely atomic force microscope probes and scanning probe microscopes; microscope probes; calibration standards, namely devices consisting of a 2-dimensional lattice of inverted square pyramids designed to calibrate atomic force microscopes, scanning probe microscopes and scanning tunneling microscopes; microscopes and microscope probes for use in the field of atomic force microscopy, scanning tunneling microscopy, and near-field optical microscopy; scanning electron microscopes and probes therefore; scanning near field optical microscope and accessories therefore, namely probes and lenses; confocal microscopes and accessories therefore, namely electronic imaging scanners; digital holographic microscopes and accessories therefor, namely objective lenses; scanning tunneling microscopes and tips therefore; interferometers; white light interferometric profilers made of metal, plastic and glass fibers and used to analyze surface topography at the nano scale; electronic mechanical vibration isolation equipment, namely a platform with instruments designed to protect against vibration and measurement distortion caused by noise, air flow, near by streets and movement of people; computer software designed to analyze images in the field of scanning probe microscopy, atomic force microscopy, near-field scanning optical microscopy and scanning tunneling microscopy; image database management software; electrical sound protection systems, namely, acoustic vibration isolation chambers; electrical power supplies; voltage surge suppressors; low pass inductor filters used in high power electrical applications
35 Retail store services in the field of Scientific apparatus and instruments, namely atomic force microscope probes and scanning probe microscopes; microscope probes; calibration standards, namely devices consisting of a 2-dimensional lattice of inverted square pyramids designed to calibrate atomic force microscopes, scanning probe microscopes and scanning tunnelling microscopes; microscopes and microscope probes for use in the field of atomic force microscopy, scanning tunnelling microscopy, and near-field optical microscopy; scanning electron microscopes and probes therefore; scanning near field optical microscope and accessories therefore, namely probes and lenses; confocal microscopes and accessories therefore, namely electronic imaging scanners; digital holographic microscopes and accessories therefor, namely objective lenses; scanning tunnelling microscopes and tips therefore; interferometers; white light interferometric profilers; mechanical vibration isolation equipment, namely instruments designed to protect against vibration and measurement distortion caused by noise, air flow, nearby streets, movement of people; computer software designed to analyse images in the field of scanning probe microscopy, atomic force microscopy, near-field scanning optical microscopy and scanning tunnelling microscopy; image database management software; acoustic vibration isolation chambers; electrical power supplies; voltage surge suppressors; low pass inductor filters used in high power electrical applications
Die Bezeichnungen wurden automatisch übersetzt. Übersetzung anzeigen

ID: 1379021737