9
Machines, apparatus, systems and installations for the carrying out of tests, testing, calibrations, including thermal, burn-in, reliability, functionality and parametric tests, of electronic devices, electronic devices at system level, micro-circuits, integrated circuit, packaged integrated circuits and wafers of semiconductor material in which integrated circuits are made; Test cards and cartridges for the aforesaid machines, apparatus, systems and installations; Computers, Peripheral devices for computers, Recording carriers for computer programs, Computer programs for controlling the aforesaid tests, trials and calibrations
42
Conducting, for others, of tests, trials, calibrations, including thermal, burn-in, reliability, functional and parametric tests, on electronic devices, system-level electronic devices, microcircuits, integrated circuits, packaged integrated circuits and wafers of semiconducting materials for use in the manufacture of integrated circuits; Engineering, research, development, analysis, design, planning, management, installation, customisation, troubleshooting, integration and maintenance of computer programs for conducting tests, trials, calibrations, including thermal, burn-in, reliability, functional and parametric tests, on electronic devices, system-level electronic devices, microcircuits, integrated circuits, packaged integrated circuits and wafers of semiconducting materials for use in the manufacture of integrated circuits and consultancy relating thereto; Engineering, research, development, analysis, design and planning of machines, apparatus, systems, installations, test cards, cartridges and computers for conducting tests, trials, calibrations, including thermal, burn-in, reliability, functional and parametric tests, on electronic devices, system-level electronic devices, microcircuits, integrated circuits, packaged integrated circuits and wafers of semiconducting materials for use in the manufacture of integrated circuits and consultancy relating thereto; Hire, leasing and rental of machines, apparatus, systems, installations, test cards, cartridges, computers, recording media for computer programs and computer programs for conducting tests, trials, calibrations, including thermal, burn-in, reliability, functional and parametric tests, on electronic devices, system-level electronic devices, microcircuits, integrated circuits, packaged integrated circuits and wafers of semiconducting materials for use in the manufacture of integrated circuits