09
Acoustic microscopes and replacement parts therefor;
acoustic inspection and analysis machines for the physical
inspection and analysis of microelectronics,
microelectromechanical systems (mems), and semiconductors;
acoustic semiconductor wafer inspection apparatus; material
testing instruments and machines, namely, acoustic
microscopy and acoustic-micro-imaging apparatus for testing
microelectronics, microelectromechanical systems (mems), and
semiconductors; electronic testing apparatus, not for
medical purposes, for testing the physical integrity of
microelectronics, microelectromechanical systems (mems), and
semiconductor wafers; semiconductor testing apparatus;
semiconductor detectors, namely, inspection devices using
acoustic microscopy and acoustic micro-imaging for
non-destructive inspection and analysis of possible defects
in microelectronics, microelectromechanical systems (mems),
and semiconductors
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