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The International trademark PIXIRAD was filed as Word mark on 09/30/2019 at the World Intellectual Property Organization.
| Trademark form | Word mark |
| File reference | 1501728 |
| Register number | UK00003405822 |
| Countries | 
|
| Base trademark |
No. UK00003405822,
August 30, 2019
|
| Application date | September 30, 2019 |
| Expiration date | September 30, 2029 |
Trademark owner
Lelyweg 1
7602 EA Almelo
NL
7602 EA Almelo
NL
Trademark representatives
Thavies Inn House,
3-4 Holborn Circus
GB
goods and services
09
Scientific, measuring and detecting apparatus and
instruments, including spectrometers, X-ray fluorescence
analysers and spectrometers, diffractometers, X-ray
diffractometers and wafer analysers, neutron activation
analysers, pulsed fast and thermal neutron activation
analysers; X-ray detecting apparatus and instruments; X-ray
measuring, detecting and monitoring instruments, indicators
and controllers; X-ray detectors; analytical apparatus for
use in analysing samples of composites for use in
scientific, industrial and laboratory applications,
including X-ray diffraction and spectrometry apparatus,
diffractometers, X-ray diffractometers, X-ray analysers,
X-ray fluorescence spectrometers, wafer analysers, X-ray
tubes; materials characterization apparatus, including
scientific and measuring apparatus and instruments,
including spectrometers, X-ray fluorescence analysers and
spectrometers, diffractometers, X-ray diffractometers and
wafer analysers; X-ray apparatus not for medical use;
analytical, process control and measuring apparatus,
including reflectometers, spectrometers, X-ray fluorescence
analysers and X-ray diffraction meters; analytical, process
control and measuring apparatus, including reflectometers,
spectrometers, X-ray fluorescence analysers and X-ray
diffraction meters for the cement, steel, aluminium,
petrochemicals, industrial minerals, glass and polymers
industry, and to customers in research and development
institutions; metrology tools, including reflectometers,
spectrometers, X-ray fluorescence analysers and X-ray
diffraction meters; reflectometers, spectrometers, X-ray
fluorescence analysers and X-ray diffraction meters for both
silicon and compound semiconductor applications; X-ray
fluorescence wafer and disc analysers [and automated
ellipsometers]; X-ray fluorescence wafer and disc analysers
[and automated ellipsometers] for the silicon semiconductor
industry, for analysing film thickness, composition and
density; diffraction apparatus [microscopy]; diffraction
apparatus and instruments; X-ray diffraction instruments,
including X-ray diffraction meters for the compound
semiconductor industry; X-ray tubes, not for medical
purposes; computer software; computer software for use in
relation to spectrometry; computer software for analysis
purposes; computer software for use in relation to
diffractometry; computer software for use in relation to
X-ray fluorescence analysis; computer software for use in
relation to the determination of X-ray intensities; computer
software for use in relation to X-ray apparatus not for
medical use; parts and fittings for all the aforesaid goods
Trademark history
| Date | Document number | Area | Entry |
|---|---|---|---|
| July 15, 2021 | 2021/29 Gaz | JP | RAW: Rule 18ter(2)(ii) GP following a provisional refusal |
| January 28, 2021 | 2021/4 Gaz | JP | Rejection |
| January 6, 2021 | 2021/1 Gaz | US | RAW: Rule 18ter(2)(ii) GP following a provisional refusal |
| June 22, 2020 | 2020/26 Gaz | EM | Rejection |
| March 24, 2020 | 2020/13 Gaz | CN | Rejection |
| January 27, 2020 | 2020/5 Gaz | US | Rejection |
| September 30, 2019 | 2019/47 Gaz | GB | Registration |
ID: 141501728