ExTOPE Logo (WIPO, 27.03.2017)
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Die Internationale Marke ExTOPE wurde als Wortmarke am 27.03.2017 bei der Weltorganisation für geistiges Eigentum angemeldet.
| Markenform | Wortmarke |
| Aktenzeichen | 1377524 |
| Länder | 
|
| Basismarke |
Nr. 2017-022013,
23. Februar 2017
|
| Anmeldedatum | 27. März 2017 |
| Ablaufdatum | 27. März 2027 |
Markeninhaber
17-1, Toranomon 1-chome,
Minato-ku
JP
Minato-ku
JP
Markenvertreter
8-2, Kanda-sudacho 2-chome,
Chiyoda-ku
JP
Waren und Dienstleistungen
09
X-ray fluorescence analyzer; spectrometer; semiconductor
testing apparatus; computer programs, recorded; downloadable
image processing software for X-ray fluorescence analyzer
and operating system software for X-ray fluorescence
analyzer; downloadable image processing software for
spectrometer and operating system software for spectrometer;
downloadable image processing software for electronic
imaging platforms in the field of semiconductor materials,
namely semiconductor wafers and reticles and operating
system software for electric imaging platforms in the field
of inspection of semiconductor materials, namely
semiconductor wafers and reticles; downloadable image
processing software for electron microscopes and operating
system software for electron microscopes; electron
microscopes
37
Repair or maintenance of laboratory apparatus and
instruments; repair or maintenance of X-ray fluorescence
analyzer; repair or maintenance of spectrometer; repair or
maintenance of electron microscopes; repair or maintenance
of measuring and testing machines and instruments; repair or
maintenance of semiconductor testing apparatus
42
Design, development and programming of computer software;
design, development and programming of computer software for
X-ray fluorescence analyzer; design, development and
programming of computer software for downloadable image
processing software for electronic imaging platforms in the
field of semiconductor materials, namely semiconductor
wafers and reticles and operating system software for
electric imaging platforms in the field of inspection of
semiconductor materials, namely semiconductor wafers and
reticles; design, development and programming of computer
software for spectrometer; design, development and
programming of computer software for electron microscopes;
providing downloadable image processing software for X-ray
fluorescence and operating system software for X-ray
fluorescence; providing downloadable image processing
software for spectrometer and operating system software for
spectrometer; providing downloadable image processing
software for electronic imaging platforms in the field of
semiconductor materials, namely semiconductor wafers and
reticles and operating system software for electric imaging
platforms in the field of inspection of semiconductor
materials, namely semiconductor wafers and reticles;
providing downloadable image processing software for
electron microscopes and operating system software for
electron microscopes
Die Bezeichnungen wurden automatisch übersetzt. Übersetzung anzeigen
Markenhistorie
| Datum | Belegnummer | Bereich | Eintrag |
|---|---|---|---|
| 24. September 2019 | 2019/39 Gaz | US | RAW: Rule 18ter(2)(ii) GP following a provisional refusal |
| 03. Dezember 2018 | 2018/49 Gaz | CN | Ablehnung |
| 08. Mai 2018 | 2018/20 Gaz | EM | Ablehnung |
| 08. Januar 2018 | 2018/2 Gaz | US | Ablehnung |
| 27. März 2017 | 2017/46 Gaz | JP | Eintragung |
ID: 141377524