EPSILON

WIPO WIPO 2016

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Die Internationale Marke EPSILON wurde als Wortmarke am 21.09.2016 bei der Weltorganisation für geistiges Eigentum angemeldet.

Markendetails Letztes Update: 11. November 2019

Markenform Wortmarke
Aktenzeichen 1332674
Länder China Japan Vereinigte Staaten von Amerika (USA)
Basismarke EU Nr. , 29. September 2024
Anmeldedatum 21. September 2016
Ablaufdatum 21. September 2026

Markeninhaber

Lelyweg 1
7602 EA Almelo
NL

Markenvertreter

Avenida Maisonnave, 22 E-03003 Alicante ES

Waren und Dienstleistungen

09 Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; none of the aforesaid goods being for use in the field of psychological testing; scientific and measuring apparatus and instruments; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers; wafer analysers; X-ray tubes; X-ray apparatus; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; spectrometers; parts and fittings for all the aforesaid; none of the aforesaid goods being for use in the field of psychological testing
37 Construction and repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid
42 Scientific and technological services and design relating thereto; design, development and programming of computer software; industrial analysis and research services; leasing and rental of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of technological advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes
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Markenhistorie

Datum Belegnummer Bereich Eintrag
02. Oktober 2019 2019/45 Gaz EM RAW: Partial Ceasing Effect
27. September 2018 2018/40 Gaz US RAW: Rule 18ter(2)(ii) GP following a provisional refusal
23. Mai 2018 2018/23 Gaz CN Ablehnung
16. Februar 2018 2018/12 Gaz EM RAW: Partial Ceasing Effect
14. Dezember 2017 2018/3 Gaz JP RAW: Rule 18ter(2)(ii) GP following a provisional refusal
29. Juni 2017 2017/26 Gaz JP Ablehnung
06. März 2017 2017/10 Gaz US Ablehnung
21. September 2016 2017/6 Gaz EM Eintragung

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