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The International trademark LTX-CREDENCE was filed as Word mark on 04/20/2010 at the World Intellectual Property Organization.
| Trademark form | Word mark |
| File reference | 1042953 |
| Countries | 
|
| Base trademark |
No. 77955745,
March 10, 2010
|
| Application date | April 20, 2010 |
| Expiration date | April 20, 2020 |
Trademark owner
825 University Avenue
Norwood MA 02062
US
Norwood MA 02062
US
Trademark representatives
Three Centerpointe Drive,
Suite 260
US
goods and services
09
Automatic test equipment and apparatus for testing
semiconductors, printed circuit boards, electronic
assemblies and related devices; automatic calibration
devices for use with semiconductor test equipment; computer
hardware, software and components for use in the operation
of test equipment and in the design, manufacture, testing,
inspection, analysis, diagnosis and verification of
semiconductors, integrated circuits, printed circuit boards,
electronic assemblies and related devices
Trademark history
| Date | Document number | Area | Entry |
|---|---|---|---|
| April 24, 2021 | 2021/16 Gaz | Deletion | |
| August 30, 2012 | 2012/39 Gaz | SG | RAW: Rule 18ter(2)(ii) GP following a provisional refusal |
| December 7, 2011 | 2013/7 Gaz | KR | RAW: Rule 18ter(2)(ii) GP following a provisional refusal |
| September 14, 2011 | 2012/15 Gaz | US | RAW: Partial Ceasing Effect |
| July 15, 2011 | 2011/29 Gaz | AM | Rejection |
| May 24, 2011 | 2011/21 Gaz | EM | Rejection |
| May 16, 2011 | 2011/27 Gaz | CN | Rejection |
| April 22, 2011 | 2011/17 Gaz | KR | Rejection |
| February 4, 2011 | 2011/25 Gaz | JP | RAW: Second Part Fee Not Paid |
| November 4, 2010 | 2010/44 Gaz | JP | Rejection |
| August 16, 2010 | 2010/34 Gaz | SG | Rejection |
| April 20, 2010 | 2010/27 Gaz | US | Registration |
ID: 141042953