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The Union trademark PANalytical AERIS was filed as Word mark on 07/13/2016 at the European Union Intellectual Property Office.
It was registered as a trademark on 11/16/2016.
The current status of the mark is "Trademark registered".
| Trademark form | Word mark |
| File reference | 015637151 |
| Application date | July 13, 2016 |
| Publication date | August 9, 2016 |
| Entry date | November 16, 2016 |
| Expiration date | July 13, 2026 |
Trademark owner
Lelyweg 1
7602 EA Almelo
NL
7602 EA Almelo
NL
Trademark representatives
Avenida Federico Soto 13
03003 Alicante
ES
goods and services
9
Scientific apparatus and instruments for use in relation to diffractometry; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers; X-ray tubes; X-ray apparatus; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; computer software for use in relation to diffractometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; parts and fittings for all the aforesaid; all of the foregoing excluding apparatus and instruments for the removal of particles and microorganisms from gases and solvents, membranes, filters and filter cartridges for the filtration of air and gas streams
37
Construction and repair of scientific apparatus and instruments for use in relation to diffractometry, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; installation of scientific apparatus and instruments for use in relation to diffractometry, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid
42
Scientific and technological services and design relating thereto in the field of diffractometry; design, development and programming of computer software in the field of diffractometry; industrial analysis and research services; leasing and rental of scientific apparatus and instruments for use in relation to diffractometry, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; design of scientific apparatus and instruments for use in relation to diffractometry, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation and use of scientific apparatus and instruments for use in relation to diffractometry, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes
Trademark history
| Date | Document number | Area | Entry |
|---|---|---|---|
| October 3, 2024 | Change Representative, Published | ||
| August 3, 2023 | Change Representative, Published | ||
| March 1, 2018 | Change Representative, Published | ||
| January 11, 2018 | Transfer / Change of address, Published | ||
| August 23, 2017 | RAW: Trade mark - Partial Surrender, Published | ||
| July 18, 2017 | Change Representative, Published | ||
| June 12, 2017 | Change Representative, Published |
ID: 11015637151