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The International trademark CERASCAN was filed as Word mark on 06/07/2023 at the World Intellectual Property Organization.
| Trademark form | Word mark |
| File reference | 1741398 |
| Countries | 
|
| Base trademark |
No. ,
July 5, 2024
|
| Application date | June 7, 2023 |
| Expiration date | June 7, 2033 |
Trademark owner
4650 Cushing Parkway
Fremont CA 94538
US
Fremont CA 94538
US
Trademark representatives
PO BOX 136
San Francisco CA 94104
US
goods and services
07
Semiconductor manufacturing machines; semiconductor
substrates manufacturing machines; semiconductor wafer
processing equipment; semiconductor wafer processing
machines; semiconductor manufacturing machines featuring
pulsed laser deposition; semiconductor substrates
manufacturing machines featuring pulsed laser deposition;
semiconductor wafer processing equipment featuring pulsed
laser deposition; semiconductor wafer processing machines
featuring pulsed laser deposition; replacement parts and
fittings for all of the aforementioned goods
09
Components for pulsed laser deposition machines for use in
the manufacture of semiconductors, namely, electrodes,
calibration devices for calibrating pressure sensors,
electric actuators, electric measurement sensors, electrical
controllers, transducers in the nature of electrical
transducers and electro-optic transducers, electronic signal
transmitters, electronic signal receivers, coaxial cables,
fiber optic cables, pressure and optical sensors, tubes
being electron tubes and photoelectric tubes, feed lines
being connection cables, electrical power supplies, power
cables, lasers not for medical use, laser diodes; components
for semiconductor manufacturing machines, namely,
electrodes, calibration devices for calibrating pressure
sensors, electric actuators, electric measurement sensors,
electrical controllers, transducers in the nature of
electrical transducers and electro-optic transducers,
electronic signal transmitters, electronic signal receivers,
coaxial cables, fiber optic cables, pressure and optical
sensors, tubes being electron tubes and photoelectric tubes,
feed lines being connection cables, electrical power
supplies, power cables, lasers not for medical use, laser
diodes; components for semiconductor substrates
manufacturing machines, namely, electrodes, calibration
devices for calibrating pressure sensors, electric
actuators, electric measurement sensors, electrical
controllers, transducers in the nature of electrical
transducers and electro-optic transducers, electronic signal
transmitters, electronic signal receivers, coaxial cables,
fiber optic cables, pressure and optical sensors, tubes
being electron tubes and photoelectric tubes, feed lines
being connection cables, electrical power supplies, power
cables, lasers not for medical use, laser diodes; components
for semiconductor wafer processing machines, namely,
electrodes, calibration devices for calibrating pressure
sensors, electric actuators, electric measurement sensors,
electrical controllers, transducers in the nature of
electrical transducers and electro-optic transducers,
electronic signal transmitters, electronic signal receivers,
coaxial cables, fiber optic cables, pressure and optical
sensors, tubes being electron tubes and photoelectric tubes,
feed lines being connection cables, electrical power
supplies, power cables, lasers not for medical use, laser
diodes; components for semiconductor substrates
manufacturing machines, namely, electrodes, calibration
devices for calibrating pressure sensors, electric
actuators, electric measurement sensors, electrical
controllers, transducers in the nature of electrical
transducers and electro-optic transducers, electronic signal
transmitters, electronic signal receivers, coaxial cables,
fiber optic cables, pressure and optical sensors, tubes
being electron tubes and photoelectric tubes, feed lines
being connection cables, electrical power supplies, power
cables, lasers not for medical use, laser diodes; components
for semiconductor wafer processing equipment, namely,
electrodes, calibration devices for calibrating pressure
sensors, electric actuators, electric measurement sensors,
electrical controllers, transducers in the nature of
electrical transducers and electro-optic transducers,
electronic signal transmitters, electronic signal receivers,
coaxial cables, fiber optic cables, pressure and optical
sensors, tubes being electron tubes and photoelectric tubes,
feed lines being connection cables, electrical power
supplies, power cables, lasers not for medical use, laser
diodes; components for semiconductor substrates
manufacturing machines, namely, electrodes, calibration
devices for calibrating pressure sensors, electric
actuators, electric measurement sensors, electrical
controllers, transducers in the nature of electrical
transducers and electro-optic transducers, electronic signal
transmitters, electronic signal receivers, coaxial cables,
fiber optic cables, pressure and optical sensors, tubes
being electron tubes and photoelectric tubes, feed lines
being connection cables, electrical power supplies, power
cables, lasers not for medical use, laser diodes;
measurement apparatus and instruments, namely, pressure
measuring apparatus and distance measuring apparatus for use
in semiconductor manufacturing, semiconductor substrates
manufacturing, and semiconductor wafer processing;
scientific apparatus and instruments, namely, ultra-high
vacuum chambers; scientific apparatus and instruments,
namely, ultra-high vacuum chambers featuring pulse laser
deposition; pulsed laser deposition apparatus for use in
research, not for medical use
Trademark history
| Date | Document number | Area | Entry |
|---|---|---|---|
| June 7, 2023 | 2023/27 Gaz | US | Registration |
ID: 141741398