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The US trademark 3VIEW was filed as Word mark on 04/19/2006 at the U.S. Patent and Trademark Office.
It was registered as a trademark on 10/20/2009.
The current status of the mark is "REGISTERED AND RENEWED".
| Trademark form | Word mark |
| File reference | 78864376 |
| Register number | 3700418 |
| Application date | April 19, 2006 |
| Publication date | June 26, 2007 |
| Entry date | October 20, 2009 |
Trademark owner
5794 W. Las Positas Blvd.
94588 Pleasanton
US
94588 Pleasanton
US
Trademark representatives
goods and services
9
microtome and digital imaging system, consisting of a microtome, specimen stage, digital control for an electron beam, back-scattered electron detector and computer software for use in controlling the microtome, the position of a specimen and the specimen stage, communicating specifications for magnification, focus, astigmatism and beam blanking to a scanning electron microscope (SEM) column, controlling the position and scanning function of an electron beam, scanning and monitoring images, integrating multiple image frames, coordinating multiple, simultaneous image inputs, controlling the pixel density, pixel dwell time, magnification, focus, aspect ratio and astigmatism of an acquired image; and re-binning image data for export to three dimensional imaging software, all for use with scanning electron microscopes
ID: 1378864376