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The US trademark EMBEDDED PROCESS VERIFICATION was filed as Word mark on 02/07/2002 at the U.S. Patent and Trademark Office. The current status of the mark is "ABANDONED-FAILURE TO RESPOND OR LATE RESPONSE".
| Trademark form | Word mark |
| File reference | 76367920 |
| Application date | February 7, 2002 |
Trademark owner
5900 Golden Hills Drive
55416 Golden Valley
US
55416 Golden Valley
US
Trademark representatives
goods and services
9
OPTICAL BASED MEASUREMENT DEVICES FOR USE IN ASCERTAINING THE SURFACE FEATURES, CONTOUR, OR SHAPE OF AN OBJECT; OPTICAL SENSORS FOR HIGH SPEED DIMENSIONAL MEASUREMENTS OF PRECISION PARTS; OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; NON-CONTACT OPTICAL SENSORS FOR USE IN THE ASSEMBLY OF ELECTRONICS; SOLDER PASTE INSPECTION SYSTEMS FOR INSPECTING AND MEASURING SOLDER PASTE ON CIRCUIT BOARDS AND SOFTWARE THERE FOR, NAMELY, OPTICAL SENSORS AND ASSOCIATED COMPUTER HARDWARE AND SOFTWARE; NON-CONTACT INSPECTION SYSTEM COMPRISED OF A SENSOR WITH A LIGHT SOURCE, LENSES AND OPTICAL DETECTORS FOR THREE DIMENSIONAL MEASUREMENT USED DURING THE MANUFACTURING PROCESS OF PRECISION PARTS; MACHINE VISION SYSTEM COMPRISING COMPONENT OPTICAL SENSORS AND COMPUTER HARDWARE AND SOFTWARE; SENSORS FOR USE IN COMPONENT PLACEMENT AND INSPECTION SYSTEMS; OPTICAL WAFER MAPPING SENSORS FOR DETECTING WAFERS IN WAFER PROCESSING SYSTEMS
ID: 1376367920