EUIPOProtect this trademark from copycats!
With our trademark monitoring alerts, you are automatically notified by email about copycats and free riders.
The Union trademark SF-3 was filed as Word mark on 03/13/2025 at the European Union Intellectual Property Office. The current status of the mark is "Application under examination".
| Trademark form | Word mark |
| File reference | 019155952 |
| Application date | March 13, 2025 |
Trademark owner
3-26-3, Shodai-Tajika, Hirakata
573-1132 Osaka
JP
573-1132 Osaka
JP
Trademark representatives
Siebertstr. 3
81675 München
DE
goods and services
9
Interferometry measuring apparatus of wafer thickness; silicon wafer thickness monitoring systems; apparatus for measuring wafer thickness; laser measuring systems; lasers for measuring; measuring equipment; electrical measuring equipment; electric measuring devices; electric measuring apparatus; electric measuring instruments; measuring apparatus and instruments; measuring, detecting, monitoring and controlling devices; measuring, detecting, monitoring and controlling equipment
ID: 11019155952