Logo (EUIPO, 09/01/2017)
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The Union trademark was filed as Figurative mark on 09/01/2017 at the European Union Intellectual Property Office.
It was registered as a trademark on 12/26/2017.
The current status of the mark is "Trademark registered".
Logodesign (Wiener Klassifikation)
#Letters repeated by mirror effect or symmetrically in any position #Letter 'F'
| Trademark form | Figurative mark |
| File reference | 017167958 |
| Application date | September 1, 2017 |
| Publication date | September 18, 2017 |
| Entry date | December 26, 2017 |
| Expiration date | September 1, 2027 |
Trademark owner
7005 Southfront Road
94551 Livermore
US
94551 Livermore
US
Trademark representatives
Gedempt Hamerkanaal 257
1021 KP Amsterdam
NL
goods and services
9
Probe stations for testing and inspecting integrated circuits and semiconductor devices; probe heads for testing integrated circuits and semiconductor devices; probe cards for testing integrated circuits and semiconductor devices; probe cards for use in connection with inspection of semiconductor devices and integrated circuits; probes for testing of integrated circuits and semiconductor devices; probes for the measurement of electronic signals; probe cards for inspecting integrated circuits and semiconductor devices; waveguide probes for on-wafer probing of circuits; positioners for probing microelectronic assemblies; testing, inspection and probing apparatus, testing, inspection, and probing instruments, computer hardware, and computer software for use in the process of manufacture, testing, and inspection of semiconductor devices and integrated circuits; optical inspection apparatus for semiconductor devices and integrated circuits; computer software for testing and inspecting integrated circuits; computer software for calibrating probes and probe stations; computer software for use in operating semiconductor and integrated circuit testing machines; chucks for supporting integrated circuits and semiconductor devices under test; thermal chucks for testing integrated circuits and semiconductor devices; testing, inspection and probing instruments for electronic reliability testing of integrated circuits and semiconductor devices
Trademark history
| Date | Document number | Area | Entry |
|---|---|---|---|
| February 26, 2024 | Change Representative, Published | ||
| January 7, 2021 | Change Representative, Published | ||
| January 5, 2021 | Change Representative, Published |
ID: 11017167958