PELMIS

WIPO WIPO 2022

Protect this trademark from copycats!

With our trademark monitoring alerts, you are automatically notified by email about copycats and free riders.

The International trademark PELMIS was filed as Word mark on 07/21/2022 at the World Intellectual Property Organization.

Trademark Details Last update: June 23, 2023

Trademark form Word mark
File reference 1686859
Register number 6366699
Countries South Korea United States of America (USA)
Base trademark JP No. 6366699, March 22, 2021
Application date July 21, 2022
Expiration date July 21, 2032

Trademark owner

2-10-1 Shin-yokohama,
Kohoku-ku,
JP

Trademark representatives

HIBIKI IP Law Firm, Asahi Bldg. 5th Floor, JP

goods and services

09 Semiconductor photomask inspection apparatus; imaging apparatus for inspection of semiconductor photomasks; semiconductor reticle inspection apparatus; imaging apparatus for inspection of semiconductor reticles; semiconductor pellicle inspection apparatus; imaging apparatus for inspection of semiconductor pellicles; measuring apparatus; inspection apparatus for semi-conductor materials and elements; detectors; material testing instruments and machines; testing apparatus not for medical purposes; precision measuring apparatus; data sets, recorded or downloadable; computer software, recorded; computer software applications, downloadable; computer programs, downloadable

Trademark history

Date Document number Area Entry
June 21, 2023 2023/25 Gaz US Rejection
July 21, 2022 2022/37 Gaz JP Registration

ID: 141686859