EZ-CURVE

WIPO WIPO 2019

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The International trademark EZ-CURVE was filed as Word mark on 08/13/2019 at the World Intellectual Property Organization.

Trademark Details Last update: January 19, 2021

Trademark form Word mark
File reference 1492208
Register number 4541636
Countries Japan South Korea Singapore United States of America (USA) China
Base trademark FR No. 4541636, August 2, 2019
Application date August 13, 2019
Expiration date August 13, 2029

Trademark owner

31 rue Casimir Périer
F-95870 BEZONS
FR

Trademark representatives

32 rue de l'Arcade F-75008 PARIS FR

goods and services

09 Instruments for measuring the curvature of a substrate on which a thin film is deposited or on which a vacuum treatment is carried out by a physical or chemical process, the substrate in question being a wafer of a metallic or semiconductor element, these instruments being used for in situ monitoring of the growth of the thin film in real time

Trademark history

Date Document number Area Entry
November 19, 2020 2020/48 Gaz JP Rejection
October 12, 2020 2020/42 Gaz KR Rejection
April 28, 2020 2020/18 Gaz US Rejection
March 19, 2020 2020/12 Gaz SG Rejection
December 31, 2019 2020/6 Gaz Deletion
December 20, 2019 2019/52 Gaz CN Rejection
November 8, 2019 2019/47 Gaz EM Rejection
August 13, 2019 2019/40 Gaz FR Registration

ID: 141492208