KLA+

WIPO WIPO 2018

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The International trademark KLA+ was filed as Figurative mark on 11/28/2018 at the World Intellectual Property Organization.

Logodesign (Wiener Klassifikation)

#Signs, notations, symbols #Letters presenting a special form of writing #Mathematical signs

Trademark Details Last update: March 31, 2021

Trademark form Figurative mark
File reference 1445505
Countries Australia Switzerland China European Community United Kingdom Indonesia Israel India Japan South Korea Mexico Norway New Zealand Philippines Russia Singapore Thailand Vietnam
Base trademark US No. 88142130, October 3, 2018
Application date November 28, 2018
Expiration date November 28, 2028

Trademark owner

One Technology Drive
Milpitas CA 95035
US

Trademark representatives

379 Lytton Avenue Palo Alto CA 94301 US

goods and services

09 Computer hardware; computer hardware and software for testing, inspecting, characterizing, and predicting physical and electrical properties of semiconductors, integrated circuits, microelectronics, wafers, and lithographic masks; instruments for testing, inspecting, and characterizing physical properties of semiconductors and integrated circuits; computer software for use in process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing industries; computer software for providing analytic data on the performance of inspection and metrology tools; computer hardware and software used for monitoring, controlling, and improving semiconductor and integrated circuit manufacturing processes; computer hardware and software used for event prediction in the manufacturing of semiconductors and integrated circuits; reconditioned computer hardware tools, namely, inspection, metrology and testing hardware that are used in field of semiconductors, thin film heads and related industries that use the same manufacturing technology; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for use in detecting defective semiconductor electronic components

Trademark history

Date Document number Area Entry
March 25, 2021 2021/13 Gaz MX RAW: Rule 18ter(2)(i) GP following a provisional refusal
December 5, 2020 2021/1 Gaz PH RAW: Rule 18ter(2)(i) GP following a provisional refusal
November 10, 2020 2020/46 Gaz CH RAW: Rule 18ter(2)(i) GP following a provisional refusal
September 10, 2020 2020/38 Gaz JP RAW: Rule 18ter(2)(ii) GP following a provisional refusal
July 9, 2020 2020/28 Gaz TH Rejection
June 29, 2020 2020/27 Gaz KR RAW: Rule 18ter(2)(ii) GP following a provisional refusal
May 7, 2020 2020/19 Gaz JP Rejection
March 5, 2020 2020/13 Gaz CH Rejection
January 29, 2020 2020/5 Gaz MX Rejection
January 17, 2020 2020/4 Gaz NO Rejection
January 16, 2020 2020/4 Gaz VN Rejection
November 29, 2019 2019/50 Gaz ID Rejection
November 5, 2019 2019/45 Gaz IL Rejection
October 14, 2019 2019/42 Gaz KR Rejection
October 14, 2019 2019/42 Gaz IN Rejection
October 1, 2019 2019/40 Gaz NZ RAW: Rule 18ter(2)(i) GP following a provisional refusal
August 22, 2019 2019/41 Gaz AU RAW: Rule 18ter(2)(i) GP following a provisional refusal
July 26, 2019 2019/31 Gaz RU Rejection
July 19, 2019 2019/29 Gaz SG Rejection
June 26, 2019 2019/26 Gaz EM Rejection
June 21, 2019 2019/26 Gaz CN Rejection
June 4, 2019 2019/24 Gaz AU Rejection
April 9, 2019 2019/15 Gaz GB Rejection
February 26, 2019 2019/9 Gaz Correction
February 13, 2019 2019/10 Gaz NZ Rejection
February 8, 2019 2019/7 Gaz PH Rejection
November 28, 2018 2019/2 Gaz US Registration

ID: 141445505