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The International trademark AZT was filed as Word mark on 08/31/2018 at the World Intellectual Property Organization.
| Trademark form | Word mark |
| File reference | 1443126 |
| Countries | 
|
| Base trademark |
No. 2018-88790,
July 9, 2018
|
| Application date | August 31, 2018 |
| Expiration date | August 31, 2028 |
Trademark owner
3-10, Fukuura,
Kanazawa-ku,
JP
Kanazawa-ku,
JP
Trademark representatives
c/o Shiga International Patent Office,
Gran Tokyo South Tower,
JP
goods and services
09
Probes for scientific purposes; semiconductor testing
apparatus; contact probes for testing semiconductors; probes
for testing semiconductors; probes for testing printed
circuit boards; probes for testing integrated circuits;
probes for testing semiconductor integrated circuit boards;
probes for testing circuit boards; parts of probes for
testing printed circuit boards, namely, plungers and
springs; testing apparatus for testing printed circuit
boards; parts of testing apparatus for testing printed
circuit boards, namely, plungers and spring; test adapters
for testing printed circuit boards; test pins for testing
printed circuit boards
Trademark history
| Date | Document number | Area | Entry |
|---|---|---|---|
| July 8, 2019 | 2019/28 Gaz | US | Rejection |
| July 5, 2019 | 2019/28 Gaz | SG | Rejection |
| August 31, 2018 | 2018/51 Gaz | JP | Registration |
ID: 141443126