WAFER metrology center

WIPO WIPO 2016

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The International trademark WAFER metrology center was filed as Figurative mark on 05/10/2016 at the World Intellectual Property Organization.

Logodesign (Wiener Klassifikation)

#Circles #Segments or sectors of circles or ellipses #Quadrilaterals #Letters presenting a special form of writing #Colours #Circles containing one or more quadrilaterals (specify the content) #Semi-circles, semi-ellipses #Several quadrilaterals juxtaposed, joined or intersecting #Quadrilaterals with dark surfaces or parts of surfaces #Series of letters in different dimensions #Two predominant colours

Trademark Details Last update: September 14, 2018

Trademark form Figurative mark
File reference 1321768
Countries Japan South Korea Singapore United States of America (USA) Switzerland China France Italy
Base trademark DE No. 30 2016 213 668, May 10, 2016
Application date May 10, 2016
Expiration date May 10, 2026

Trademark owner

Mallaustr. 72
68219 Mannheim
DE

goods and services

09 Optical measuring apparatus

Trademark history

Date Document number Area Entry
September 10, 2018 2018/37 Gaz KR RAW: Rule 18ter(2)(ii) GP following a provisional refusal
March 23, 2018 2018/17 Gaz US RAW: Rule 18ter(2)(ii) GP following a provisional refusal
December 19, 2017 2017/52 Gaz KR Rejection
November 10, 2017 2017/46 Gaz CH Rejection
October 30, 2017 2018/7 Gaz IT Rejection
August 9, 2017 2017/32 Gaz CN Rejection
June 12, 2017 2017/25 Gaz KR Rejection
April 25, 2017 2017/17 Gaz SG Rejection
April 3, 2017 2017/23 Gaz FR Rejection
March 16, 2017 2017/11 Gaz JP Rejection
December 12, 2016 2016/51 Gaz US Rejection
May 10, 2016 2016/47 Gaz DE Registration

ID: 141321768