WAFER metrology center Logo (WIPO, 05/10/2016)
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The International trademark WAFER metrology center was filed as Figurative mark on 05/10/2016 at the World Intellectual Property Organization.
#Circles #Segments or sectors of circles or ellipses #Quadrilaterals #Letters presenting a special form of writing #Colours #Circles containing one or more quadrilaterals (specify the content) #Semi-circles, semi-ellipses #Several quadrilaterals juxtaposed, joined or intersecting #Quadrilaterals with dark surfaces or parts of surfaces #Series of letters in different dimensions #Two predominant colours
Trademark form | Figurative mark |
File reference | 1321768 |
Countries | |
Base trademark | No. 30 2016 213 668, May 10, 2016 |
Application date | May 10, 2016 |
Expiration date | May 10, 2026 |
Date | Document number | Area | Entry |
---|---|---|---|
September 10, 2018 | 2018/37 Gaz | KR | RAW: Rule 18ter(2)(ii) GP following a provisional refusal |
March 23, 2018 | 2018/17 Gaz | US | RAW: Rule 18ter(2)(ii) GP following a provisional refusal |
December 19, 2017 | 2017/52 Gaz | KR | Rejection |
November 10, 2017 | 2017/46 Gaz | CH | Rejection |
October 30, 2017 | 2018/7 Gaz | IT | Rejection |
August 9, 2017 | 2017/32 Gaz | CN | Rejection |
June 12, 2017 | 2017/25 Gaz | KR | Rejection |
April 25, 2017 | 2017/17 Gaz | SG | Rejection |
April 3, 2017 | 2017/23 Gaz | FR | Rejection |
March 16, 2017 | 2017/11 Gaz | JP | Rejection |
December 12, 2016 | 2016/51 Gaz | US | Rejection |
May 10, 2016 | 2016/47 Gaz | DE | Registration |
ID: 141321768