T

USPTO USPTO 2004 CANCELLED - SECTION 8

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The US trademark T was filed as Word and figurative mark on 04/22/2004 at the U.S. Patent and Trademark Office.
It was registered as a trademark on 06/24/2008. The current status of the mark is "CANCELLED - SECTION 8".

Trademark Details

Trademark form Word and figurative mark
File reference 78406211
Register number 3453698
Application date April 22, 2004
Publication date April 8, 2008
Entry date June 24, 2008

Trademark owner

Hirakata-shi
Osaka
JP

Trademark representatives

goods and services

9 Apparatus for inspecting semiconductors; apparatus for analyzing chemical components of organic and inorganic materials; apparatus for analyzing the substance structure of organic and inorganic materials; measuring and analyzing apparatuses, namely, X-ray fluorescence spectrometers, X-ray absorption fine structure analyzing apparatus, X-ray diffractmeters, mass spectrometers, spectrophotometers, magnetic resonance apparatus, chromatograph apparatus; electron microscopes; non-medical industrial X-ray machines; non-medical X-ray apparatus for industrial use; computer programs for use in semiconductor inspection, chemical analysis and X-ray inspection or analysis; electronic publications, namely, electronic books, electronic magazines, and electronic newspapers recorded in computer recording media relating to semiconductor inspection, chemical analysis and X-ray inspection or analysis; computers
40 Manufacturing of semiconductors to order and/or specification of others; information and consultancy services in the field of manufacturing semiconductors to order and/or specification of others; treatment of metals, rubber, plastic and ceramic materials; rental of chemical processing machines and apparatus
41 Instructional and educational services, namely, arranging and organizing classes, seminars, working groups, research groups, conferences and conventions in the fields of manufacturing, inspecting, and analyzing semiconductors, analyzing chemical components, structurally analyzing substances, and inspecting and analyzing materials employing X-ray technology, and the distribution of printed and electronic course materials in connection therewith; publishing of electronic publications
42 Inspection and analysis of semiconductors; information and consultancy services in the fields of inspection and analysis of semiconductors, analysis of chemical components, and structural analysis of substances; analysis of chemical components for others; chemical analysis, namely, structural analysis of substances for others; technical consulting services relating to the performance and operation of apparatuses; designing of machines, apparatuses, instruments, systems and parts therefore of machines for use in the fields of manufacturing, inspecting, and analyzing semiconductors, analyzing chemical components, structurally analyzing substances, and inspecting and analyzing materials employing X-ray technology; computer software design, computer programming, and maintenance of computer software; testing, inspection and research of pharmaceuticals, cosmetics and foodstuffs; testing and research in the fields of electricity, X-ray technology, machines and apparatuses; rental of measuring and testing machines and instruments; rental of industrial X-ray machines and apparatuses; rental of computers; rental of laboratory apparatuses and instruments

ID: 1378406211