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The US trademark FABSTAT was filed as Word mark on 06/24/2002 at the U.S. Patent and Trademark Office. The current status of the mark is "ABANDONED-FAILURE TO RESPOND OR LATE RESPONSE".
Trademark owner
P.O. Box 7960
907 19 UMEA
SE
907 19 UMEA
SE
Trademark representatives
goods and services
9
Computer software, namely, a real-time semiconductor fabric-wide wafer tool software package for advanced process fault detection used to monitor information from tooling on the manufacturing line.; Computer software, namely, a real-time semiconductor fabric-wide wafer tool software package for advanced process fault detection used to monitor information from tooling on the manufacturing line.
ID: 1378138273