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The US trademark EXCELLENCE IN NANOMETROLOGY was filed as Word mark on 08/02/2007 at the U.S. Patent and Trademark Office.
It was registered as a trademark on 06/17/2008.
The current status of the mark is "CANCELLED - SECTION 8".
| Trademark form | Word mark |
| File reference | 77245031 |
| Register number | 3451584 |
| Application date | August 2, 2007 |
| Entry date | June 17, 2008 |
Trademark owner
KANC 4F, lui-Dong 906-10
443-766 Suwon
KR
443-766 Suwon
KR
Trademark representatives
goods and services
9
instruments for carrying out microscale and nanoscale measurements and analyses, namely, scanning probe microscopes and atomic force microscopes
ID: 1377245031