USPTOProtect this trademark from copycats!
With our trademark monitoring alerts, you are automatically notified by email about copycats and free riders.
The US trademark PANALYTICAL was filed as Word mark on 04/04/2002 at the U.S. Patent and Trademark Office.
It was registered as a trademark on 12/13/2005.
The current status of the mark is "REGISTERED AND RENEWED".
| Trademark form | Word mark |
| File reference | 76391600 |
| Register number | 3029656 |
| Application date | April 4, 2002 |
| Publication date | July 1, 2003 |
| Entry date | December 13, 2005 |
Trademark owner
LELYWEG 1
NL-7602 EA ALMELO
NL
NL-7602 EA ALMELO
NL
Trademark representatives
goods and services
9
Analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, x-ray fluorescence analyzers and x-ray diffraction meters for the cement, steel, aluminum, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, namely, reflectometers, spectrometers, x-ray fluorescence analyzers and x-ray diffraction meters for both silicon and compound semiconductor applications, x-ray fluorescence wafer and disc analyzers [ and automated ellipsometers ] for the silicon semiconductor industry, for analyzing film thickness, composition and density; x-ray diffraction, namely, x-ray diffraction meters for the compound semiconductor industry; x-ray tubes, not for medical purposes; operating software for industrial process control and for research and development applications
ID: 1376391600