DESIGN TESTSTATION

USPTO USPTO 2001 ABANDONED-FAILURE TO RESPOND OR LATE RESPONSE

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The US trademark DESIGN TESTSTATION was filed as Word mark on 03/14/2001 at the U.S. Patent and Trademark Office. The current status of the mark is "ABANDONED-FAILURE TO RESPOND OR LATE RESPONSE".

Trademark Details Last update: August 3, 2019

Trademark form Word mark
File reference 76224932
Application date March 14, 2001

Trademark owner

3201 Scott Boulevard
95054 Santa Clara
US

Trademark representatives

goods and services

9 Automatic test equipment for testing electrical properties of semiconductor integrated circuits, semiconductor test system for testing semiconductor integrated circuits, memory tester for testing semiconductor memory integrated circuits, logic tester for testing semiconductor logic integrated circuits
42 Providing semiconductor integrated circuit test service, namely, evaluating semiconductor integrated circuit design data, testing semiconductor devices, providing technical assistance in semiconductor device testing, exchanging design and test information on semiconductor integrated circuits

ID: 1376224932