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The US trademark METROLOGY 1, 2, 3 was filed as Word mark on 09/15/2000 at the U.S. Patent and Trademark Office. The current status of the mark is "ABANDONED - NO STATEMENT OF USE FILED".
| Trademark form | Word mark |
| File reference | 76128400 |
| Application date | September 15, 2000 |
| Publication date | May 21, 2002 |
Trademark owner
87 CHURCH STREET
06108 EAST HART-FORD
US
06108 EAST HART-FORD
US
Trademark representatives
goods and services
9
Metrology tool for optically measuring properties of semiconductor wafers at various stages during fabrication of semiconductor devices, including an optical sensor, a wafer-support stage, electronic data processing means, and mechanical and software interfaces for integration with wafer-loading tools and wafer-processing tools
ID: 1376128400