TEST ARRAY

USPTO USPTO 1997 ABANDONED-FAILURE TO RESPOND OR LATE RESPONSE

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The US trademark TEST ARRAY was filed as Word mark on 12/15/1997 at the U.S. Patent and Trademark Office. The current status of the mark is "ABANDONED-FAILURE TO RESPOND OR LATE RESPONSE".

Trademark Details Last update: May 7, 2018

Trademark form Word mark
File reference 75404920
Application date December 15, 1997

Trademark owner

32-1 Asahicho 1-chome
Nerima-ku, Tokyo
JP

Trademark representatives

goods and services

9 Electronic machines and apparatus for testing semiconductors (including large scale integrated circuits); Electronic circuits, magnetic discs, and magnetic discs with prerecorded programs for aforesaid electronic machines and apparatus

ID: 1375404920