FEI

USPTO USPTO 1990 CANCELLED - SECTION 8

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The US trademark FEI was filed as Figurative mark on 12/17/1990 at the U.S. Patent and Trademark Office.
It was registered as a trademark on 03/31/1992. The current status of the mark is "CANCELLED - SECTION 8".

Trademark Details Last update: April 24, 2018

Trademark form Figurative mark
File reference 74123931
Register number 1681042
Application date December 17, 1990
Publication date January 7, 1992
Entry date March 31, 1992

Trademark owner

7451 NW Evergreen Parkway
971245830 Hillsboro
US

Trademark representatives

goods and services

9 high brightness, submicron focused ion and electron beam systems using field emission technology; namely, for ion beam micromachining, ion milling, ion lithography, ion microscopes, secondary ion mass spectroscopy, electron microscopes and combined ion beam milling/electron microscope systems; high brightness, submicron ion and electron beam columns using field emission technology; namely, ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy, electron beam lithography, and electron beam microscopy; single crystal source materials; namely, refractory metals, LaB6 Mini-Vogel Mount cathodes, cold field emitters, Schottky emitters, and liquid metal ion sources

ID: 1374123931