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The Union trademark APPLIED PRECISION was filed as Word mark on 10/09/2007 at the European Union Intellectual Property Office.
It was registered as a trademark on 12/02/2009.
The current status of the mark is "Trademark registered".
| Trademark form | Word mark |
| File reference | 006344477 |
| Application date | October 9, 2007 |
| Publication date | September 15, 2008 |
| Entry date | December 2, 2009 |
| Expiration date | October 9, 2027 |
Trademark owner
100 Results Way
01752 Marlborough
US
01752 Marlborough
US
Trademark representatives
Claude Debussylaan 54
1082 MD Amsterdam
NL
goods and services
7
Precision positioning equipment, namely, mechanical actuators, screw actuators, electrical motors; hydrodynamic cleaning apparatus for cleaning particulate matter from industrial substrates
9
Electrical and scientific apparatus, namely, automated DNA optical scanning equipment; automated microscopy system and software for high content imaging of microtiter plates, microscope slides and biological samples; hardware and software systems for use in the inspecting and analysis of biological samples; optical imaging equipment; precision positioning equipment, namely, electronic control circuitry; hardware and software systems comprised of computers, computer software, electronic hardware and mechanical hardware for micropositioning control, namely, the design, manufacture and application of micropositioning control in precision actuators, control systems for photonics, digital flow control, semiconductor test and inspection, and microscopy and scanning systems; hardware device for adjusting laser frequency of tunable laser sources; high precision electric computer controlled valves for use in high precision flow applications; computer software for microscopy, imaging, and informatics; process control system comprised of data analysis software, and imaging and inspection hardware and software used for quality control analysis of the probing process used in the manufacture of semiconductor wafers; hardware and software systems for use in the optical inspection of semiconductor wafers; electrical and scientific apparatus, namely, semiconductor wafer probe mark analysis equipment and stations; probecard metrology systems comprised of hardware and software for use in the manufacturing, testing, and repair of probecards used in the testing of semiconductor wafers
Trademark history
| Date | Document number | Area | Entry |
|---|---|---|---|
| January 5, 2021 | Change Representative, Published | ||
| February 10, 2020 | Change Representative, Published | ||
| January 31, 2020 | Transfer / Change of address, Published | ||
| October 4, 2018 | Transfer / Change of address, Published | ||
| March 23, 2018 | Change Representative, Published | ||
| June 1, 2017 | Extension, Trade mark renewed | ||
| October 13, 2015 | Transfer / Change of address, Published | ||
| May 14, 2014 | Change Representative, Published | ||
| May 2, 2014 | Change Representative, Published | ||
| February 21, 2014 | Transfer / Change of address, Published | ||
| January 17, 2012 | Change Representative, Published | ||
| September 15, 2008 | Transfer / Change of address, Published | ||
| August 28, 2008 | Transfer / Change of address, Registered |
ID: 11006344477