SCRIBEVIEW

EUIPO EUIPO 2006 Trademark registered

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The Union trademark SCRIBEVIEW was filed as Word mark on 02/10/2006 at the European Union Intellectual Property Office.
It was registered as a trademark on 03/05/2007. The current status of the mark is "Trademark registered".

Trademark Details Last update: February 4, 2022

Trademark form Word mark
File reference 004894358
Application date February 10, 2006
Publication date August 14, 2006
Entry date March 5, 2007
Expiration date February 10, 2026

Trademark owner

6 Hamechkar Street
2306990 Migdal HaEmek
IL

Trademark representatives

Calle Italia, 22 Local Bajo 03003 Alicante ES

goods and services

9 Scientific, measuring and analytical apparatus and instruments; scientific, measuring and analytical apparatus for materials characterisation; x-ray metrology apparatus for semi-conductors and materials; optical and x-ray scattering apparatus and instruments; materials characterisation and materials testing apparatus and instruments; apparatus and instruments for analysing and testing thin films, metallic thin films, multi-layers, ceramics, superconductors, and semi-conductor materials; x-ray apparatus and instruments; x-ray tubes; x-ray cameras; x-ray detectors; diffractometers; reflectometers; x-ray topography apparatus and instruments; surface Brillouin scattering and surface Brillouin spectroscopy apparatus and instruments; powder, single crystal and high resolution diffraction measuring apparatus and instruments; computer hardware and computer software adapted for use with all the aforementioned goods; parts and fittings for all the aforementioned goods
42 Scientific and technological services and research and design relating thereto; industrial analysis and research services; scientific and technological services relating to x-ray metrology for semi-conductors and materials; consulting services relating to x-ray technology; design and development of computer hardware and computer software adapted for use with scientific, measuring and analytical apparatus for materials characterisation, x-ray metrology apparatus for semi-conductors and materials, and optical and x-ray scattering apparatus and instruments; consultancy, information and advisory services in relation to the aforementioned services

Trademark history

Date Document number Area Entry
February 3, 2022 Transfer / Change of address, Published
February 1, 2022 Transfer / Change of address, Published
January 13, 2022 Transfer / Change of address, Published
January 10, 2022 Change Representative, Published
June 25, 2020 RAW: Representative - Deletion of the representative, Published
April 25, 2019 Change Representative, Published
January 7, 2016 Extension, Trade mark renewed
November 11, 2015 Change Representative, Published
January 10, 2010 Transfer / Change of address, Published

ID: 11004894358