9
Measuring and analytical apparatus and instruments; optical and x-ray scattering apparatus and instruments; materials characterisation and materials testing apparatus and instruments; apparatus and instruments for analysing and testing thin films, metallic thin films, multi layers, ceramics, superconductors, and semi-conductor materials; x-ray apparatus and instruments; x-ray tubes; x-ray cameras; x-ray detectors; diffactometers; reflectometers; x-ray topography apparatus and instruments; surface brillouin scattering and surface brillouin spectroscopy apparatus and instruments; computer hardware adapted for use with the aforesaid; computer software adapted for use with aforesaid; parts and fittings for the aforesaid
42
Consulting services in x-ray technology, measuring and analytical apparatus and instruments, optical and x-ray scattering apparatus and instruments, materials characterisation and materials testing apparatus and instruments, apparatus and instruments for analysing and testing thin films, metallic thin films, multi layers, ceramics, superconductors, and semi-conductor materials, x-ray apparatus and instruments, x-ray tubes, x-ray cameras, x-ray detectors, diffractometers, reflectometers, x-ray topography apparatus and instruments, surface brillouin scattering and surface brillouin spectroscopy apparatus and instruments, powder, single crystal and high resolution diffraction measuring apparatus and instruments, computer hardware adapted for use with the aforesaid, computer software adapted for use with aforesaid